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Semiconductor Characterization Equipment
Probing Accessories
Wentworth’s complete range of wafer probing accessories and options is designed to complement and enhance the capabilities and performance of its wafer probe stations. A global support team offers expert capability to design and develop solutions, to help you create ideal conditions for accurate, reliable and repeatable test results.
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Semiconductor Characterization Equipment
Probe Cards
With specialist probe card facilities based in Europe and North America, Wentworth builds a wide range of standard and custom cantilever probe cards based on epoxy and blade technologies.
Its epoxy probe cards can accommodate high pin counts and benefit from competitive pricing and quick turn-around times. The company also has the expertise to build blade probe cards and offer a wide range of parts for their repair. All probe cards are supported by a fast maintenance and repair service.
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Semiconductor Characterization Equipment
Production Wafer Probers
Wentworth’s range of production wafer probers offers rapid probing with a choice of semi-automatic, fully automatic and double-sided wafer probing platforms. They are ideally suited for characterization of wafer sizes from 2” to 12″ (up to 300 mm), for full or partial wafers.
All Wentworth’s production wafer probers utilize the Pegasus™ controller architecture which provides a robust and reliable production platform. All stages are controlled by Pegasus™ consisting of the drive electronics, joystick, keypad and optional Windows user interface. Interfacing is easy with TTL, GPIB (IEEE488.2) and RS232 ports located on the back panel.
Boasting a full range of accessories including manipulators, enclosures, antivibration tables, prober control software, chucks, optics and lasers means that each prober can be fully customized for your specific application.
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Semiconductor Characterization Equipment
Analytical Wafer Probers
Wentworth offers a range of high precision analytical wafer probe stations including semi-automatic and manual probers for wafer sizes up to 300 mm to suit your budget. Experienced teams of consultants and global representatives can configure a full turnkey solution to suit your specific needs.
Specifically designed for failure analysis, device characterization and other analytical testing, all probe stations benefit from a full range of prober accessories including manipulators, enclosures, antivibration tables, prober control software, chucks, lasers and optics. This means you can upgrade your wafer probe station at any time to suit future probing goals.
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Arbitrary Output DC Power Supplies, Battery Analyzers, DC Power Supplies, Power Sources & Measurement, Rechargeable Batteries, Semiconductor Characterization Equipment, Semiconductor Source Measure Units, Test & Measurement
GS820 MULTI CHANNEL SOURCE MEASURE UNIT
The GS820 is equipped with two analog channels with each channel consisting of a constant voltage source VS, a constant current source IS, a voltmeter VM, and an ammeter IM. The two source measure channels are isolated.
- DC voltage/current reference, pulse voltage/current source
- V-I curve trace, semiconductor parametric test
- Programmable arbitrary waveform generation
- Electric load, resistance measurement
- Production test
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Arbitrary Output DC Power Supplies, Battery Analyzers, DC Power Supplies, Power Sources & Measurement, Rechargeable Batteries, Semiconductor Characterization Equipment, Semiconductor Source Measure Units, Test & Measurement
GS610 SOURCE MEASURE UNIT
The GS610 is a highly accurate and highly functional programmable voltage/current source that incorporates voltage/current generation and measurement functions. The maximum output voltage and current are 110 V and 3.2 A, respectively. Evaluation of over a wide range of basic electrical characteristics is possible, because the GS610 can operate as a current source or a current sink.
