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Battery Analyzers, Battery Simulator, Rechargeable Batteries, Test & Measurement
C8000 BATTERY TESTING SYSTEM
BY ALL IMAGINATION, THE CADEX C8000 MAY WELL BE THE MOST COMPLETE BATTERY TESTING SYSTEM AVAILABLE.
The Cadex C8000 delivers the versatility needed to ensure you get the right performance from the batteries used in your applications. The C8000 is a multi-purpose tool that allows you to optimize batteries at every stage of product life.
You can capture load signatures of power tools and laptops and then perform simulated battery runtime by replying the stored data. Add a thermal chamber,
external load bank and other accessories, and you begin realizing that the
Cadex C8000 stands in a class by itself at an affordable price.- Device Simulation helps you choose the right battery
- Life Cycle Testing helps you characterize the battery
- Custom Programming helps you monitor quality and performance
- Service Programs help you maintain the battery
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ATE Systems, LXIbus Instruments, PXIbus Instruments, Test & Measurement
CMX09 9-SLOT 3U PXIE HIGH PERFORMANCE RUGGED CHASSIS, UP TO 8 GB/S BANDWIDTH
- 9-slot PXI Express chassis with 1 system controller slot, 6 peripheral slots, 1 hybrid slot and 1 timing slot
- High bandwidth PCIe Gen 2 backplane with 2 GB/s slot bandwidth and 8 GB/s system bandwidth
- Combine with EMX-2500 LXI controller for Ethernet connectivity and distributability in the EMX09
- True 4U chassis
- Rugged construction with extended temperature range
- Smart switch display for health monitoring and control
- First PXI Multicomputing (PXImc) ready chassis
- Rack mount, custom front panels, and bolt-down option available
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ATE Systems, LXIbus Instruments, PXIbus Instruments, Test & Measurement
CMX18 18-SLOT 3U PXI EXPRESS CHASSIS, UP TO 8 GB/S BANDWIDTH
- 18-slot PXI Express chassis with 1 system controller slot, 6 peripheral slots, 10 hybrid slots, and 1 timing slot
- High bandwidth PCIe Gen 2 backplane with 2 GB/s bandwidth per slot (4 GB/s on high-bandwidth slots) and 8 GB/s system bandwidth
- Rugged construction with extended temperature range
- True 4U chassis
- IEEE-1588 distributed instrument synchronization
- Built-in system-monitoring provides confidence in system operation and simplifies debugging
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ATE Systems, LXIbus Instruments, PXIbus Instruments, Switching Systems, Test & Measurement
CMX34 INTEGRATED PXIE/LXI SUBSYSTEM WITH RECEIVER INTERFACE MECHANISM
- Achieve best performance with hybrid test system that combines exceptional data throughput of PXIe with increased board-space in an LXI mainframe optimized for signal switching.
- PXIe mainframe with high bandwidth PCIe Gen 2 backplane with 2 GB/s bandwidth per slot and 8 GB/s system bandwidth
- EX1200 LXI mainframe for signal switching and I/O where the real estate allows instrument-grade performance
- Fully integrated including cables and receiver modules, ready to drop into a test system
- Subsystems engineered to maximize signal integrity and delivered fully tested and verified to guarantee results
- Save time and money in sourcing, development and deployment
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ATE Systems, LXIbus Instruments, Test & Measurement
EMX-2500 GIGABIT ETHERNET LXI CONTROLLER FOR EMX SERIES PXIE INSTRUMENTS
- Industry’s first gigabit Ethernet LXI Remote controller for PXI Express
- Up to 100 MB/s sustained throughput
- Allows remote access to VTI’s SentinelEX PXIe instruments from anywhere in the world on any internet enabled device
- Multi-chassis synchronization using precision IEEE-1588-2008 standard time source
- Easy to set up for distributed data acquisition systems
- Simplified instrument discovery and usage – just type in the IP address to connect to the instrument
- IVI drivers supporting wide variety of Application Development Environments and Operating Systems
- REST HTTP protocol for cloud support and advanced web applications
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ATE Systems, LXIbus Instruments, PXIbus Instruments, Test & Measurement
EMX-2401 INTEL CORE I5 2.4 GHZ, 8 GB RAM, 160 GB HARD DRIVE, PXIE EMBEDDED CONTROLLER
- Powerful computing power with Intel® Core™ i5-520E 2.4 GHz processor
- Dual Channel DDR3 SODIMM, Up to 8 GB 1066 MHz
- Up to 2 GB/s system throughput
- PXI Express Link Capability Four Links Configuration x4 or Two Links x8
- Integrated SATA hard drive, 160 GB 7200 RPM
- Integrated I/O enabling Hybrid test-systems: Dual Gigabit Ethernet ports, Four USB 2.0 ports, Micro-D GPIB connector, DVI-I video connector, ExpressCard/34 expansion slot, Trigger I/O for advanced PXI™ trigger functions
- Programmable watchdog timer
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ATE Systems, Data Acquisition Systems, Physical Measurements, PXIbus Instruments, Sound and Vibration, Test & Measurement
EMX-4251 8-CHANNEL, 204.8 KSA/S SMART PXIE DSA DIGITIZER
- 204.8 kSa/s/channel, 24-Bit ADC’s, 8-Channel
- Differential inputs deliver superior common mode performance
- Flexible analog and user defined digital filter combinations
- -105 dB SFDR
- Seven auto-ranging input ranges from 100 mV to 10 V
- Deterministic channel-to-channel, card-to-card, and chassis-to-chassis phase response
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ATE Systems, Data Acquisition Systems, Physical Measurements, PXIbus Instruments, Sound and Vibration, Test & Measurement
EMX-4250 16-CHANNEL, 204.8 KSA/S SMART PXIE DSA DIGITIZER
- 204.8 kSa/s/channel, 24-Bit ADC’s, 16-Channel
- Differential inputs deliver superior common mode performance
- Flexible analog and user defined digital filter combinations
- -105 dB SFDR
- Seven auto-ranging input ranges from 100 mV to 10 V
- Deterministic channel-to-channel, card-to-card, and chassis-to-chassis phase response
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ATE Systems, PXIbus Instruments, Test & Measurement
EMX-4016 16 CHANNEL BREAKOUT BOX FOR USE WITH EMX-425X
- Designed to work with EMX-4250/EMX-4251
- 8 channel (EMX-4008) and 16 (EMX-4016) channel variants available
- LED Channel Health Indicator
- BNC Connections for signals
- External Trigger Connector
- External Calibration Input Connector
- Rack mountable
