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POWER RF Meter, Radio Frequency & Microwave, Test & Measurement
Saluki S2438
S2438 series microwave power meter is composed of a host of microwave power meter and a series of microwave power sensors. S2438 series have a wide frequency band, large dynamic power range, high precision, fast measurement and analysis, serialization of sensors.
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Radio Frequency & Microwave, RF & Microwave Signal Generators, Test & Measurement
Saluki S1465
S1465 series microwave signal generators, with the frequency range of 100kHz – 67GHz, are provided with high purity spectrum and high output power. The single side band phase noise at 10GHz carrier and 10kHz frequency offset is -126dBc/Hz. The maximum output power reaches up to 1W at 20GHz carrier, and the dynamic output power range gets 150dB. All these specifications can meet the high-end requirements of electromagnetic signal tests.
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Radio Frequency & Microwave, RF & Microwave Signal Generators, Test & Measurement
Saluki S1132
S1132 Series Multi-Standard Signal Generator (9kHz – 6GHz)
The Saluki S1132 Series RF Signal Generator provides a wide range of product choices for different functional requirements and application scenarios. Each type of product has outstanding features in its function to characterize the focus of its testing field.
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Analog & Digital Audio Test, AUDIO ANALYZER, Test & Measurement
TS digital and analogue audio test set
Self contained touch screen version of the dScope Series III hardware.
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Analog & Digital Audio Test, AUDIO ANALYZER, Test & Measurement
dScope Series III
The dScope Series III is a comprehensive and powerful measurement system for analogue and digital audio generation and analysis, including digital audio carrier parameters, acoustic transducers and Windows™ sound devices (WDM or ASIO).
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Analog & Digital Audio Test, AUDIO ANALYZER, Test & Measurement
dScope M1
The dScope M1 interface provides the most comprehensive and lowest cost solution for audio electronics and transducer testing.
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Power Sensor Calibration System, Radio Frequency & Microwave, Test & Measurement
TEGAM 1314 RF High Power Calibration System
TEGAM RF High Power Calibration System
Calibrate High Power RF Sensing devices up to 250 W with uncertainty less than 1%
Working standards like a TEGAM 2601A
Through devices like a Bird Wattmeter
High Power RF Power Sensors from Keysight, R&S, and Anritsu
60 Hz to 3000 MHz Frequency Range
National Lab Traceable through an AC Power Standard -
General Laboratory Instruments, Sensitive Measurements, Test & Measurement
TEGAM Model 1740
TEGAM Model 1740 High Speed Microohmmeter, including GPIB & RS-232
Basic Accuracy: 0.02%
Measurement Speed: 10 ms
Range: 20 mΩ to 20 MΩ
Resolution: 1 µΩ
Programmable reference currents
Kelvin Klips, Spade Lugs or Kelvin Probes available
Easy to operate and easy to integrate
1-year warranty on this Microohmmeter
Made in USA -
General Laboratory Instruments, LCR METERS, Test & Measurement
TEGAM Model 253 LCR
TEGAM Model 253 LCR Meter Auto-ranging LCR Meter, 1 kHz, Battery Powered
Basic Accuracy: 0.25%
Measurement Speed: 250 ms
Test Frequency: 1 kHz
Automatic L, C, R, G and D measurements
Auto Ranging
Shielded Kelvin Connections
Rechargeable Battery Power Pack
Rear Panel External Bias Terminals
Calibration Certificate Included
1-year warranty
Made in USA -
Data Acquisition Systems, General Laboratory Instruments
DATAQ DI-4718B
DATAQ DI-4718B Data Acquisition and Data Logger Products
Measures temperature, pressure, flow, current, voltage, and more using isolated 8B amplifiers. View the DI-8B amplifier selection guideLow-Cost, Portable, USB or Ethernet Data Logger
Eight DI-8B signal-conditioned analog inputs. Expandable with ChannelStretch™ (Unlock code required for each instrument)
Stand-alone data logger option allows in-the-field measurements to be saved to flash memory (unlock code required for each instrument to record all channels to flash memory)
Up to 16-bit analog to digital conversion
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Data Acquisition Systems, General Laboratory Instruments
DATAQ Model DI-4108-U
DATAQ Model DI-4108-U
USB DAQ and Data Logger, 12 to 16-bit resolution, 160,000 S/s Throughput, Records to USB flash drive
Includes a DI-4108 instrument, a 6-foot USB cable, a screwdriver for signal connections, and a USB flash drive with WinDaq/Lite software (downloadable at run.dataq.com) and an NIST-traceable calibration certificate (.pdf)Provided with WinDaq/Lite Software, which records up to four channels at any sampling rate. WinDaq/Unlock code required per device for data synchronization in WinDaq.
Stand-alone capability to USB thumb drive (Unlock Code required to record all channels to USB thumb drive – See Accessories)
Up to 160,000 Hz Sample Throughput Rate using WinDaq Acquisition software
Up to 160,000 Hz Sample Throughput Rate in stand-alone mode using high speed microSD card
12 to 16-bit analog-to-digital resolution (Calculate Resolution)
Programmable ranges: ±200, ±500 mV, ±1, ±2, ±5, ±10 V full scale
Eight armored analog differential inputs*
Up to 120 V rms without damage
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Data Acquisition Systems, General Laboratory Instruments
DATAQ Model DI-808
DATAQ Model DI-808
Eight-channel Web-based Voltage, Thermocouple, and Pulse Data Logger
Includes a DI-808 instrument, a screwdriver for signal connections, a power supply, and an NIST-traceable calibration certificateNo software to install
Intelligent data logger with built-in web server works with with any device using a modern web browser
Stores data locally to internal flash memory or a USB thumb drive and/or remotely to any accessible server or email address
Allows remote real time display and configuration
Eight differential and isolated analog input channels programmable as voltage or thermocouple per channel measuring ±10mV, ±25mV, ±50mV, ±100mV, ±250mV, ±500mV, ±1V, ±2.5V, ±5V, ±10V, ±25V, or ±50V; or Thermocouple types J, K, T, B, R, S, E, or N
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Semiconductor Characterization Equipment
Probing Accessories
Wentworth’s complete range of wafer probing accessories and options is designed to complement and enhance the capabilities and performance of its wafer probe stations. A global support team offers expert capability to design and develop solutions, to help you create ideal conditions for accurate, reliable and repeatable test results.
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Semiconductor Characterization Equipment
Probe Cards
With specialist probe card facilities based in Europe and North America, Wentworth builds a wide range of standard and custom cantilever probe cards based on epoxy and blade technologies.
Its epoxy probe cards can accommodate high pin counts and benefit from competitive pricing and quick turn-around times. The company also has the expertise to build blade probe cards and offer a wide range of parts for their repair. All probe cards are supported by a fast maintenance and repair service.
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Semiconductor Characterization Equipment
Production Wafer Probers
Wentworth’s range of production wafer probers offers rapid probing with a choice of semi-automatic, fully automatic and double-sided wafer probing platforms. They are ideally suited for characterization of wafer sizes from 2” to 12″ (up to 300 mm), for full or partial wafers.
All Wentworth’s production wafer probers utilize the Pegasus™ controller architecture which provides a robust and reliable production platform. All stages are controlled by Pegasus™ consisting of the drive electronics, joystick, keypad and optional Windows user interface. Interfacing is easy with TTL, GPIB (IEEE488.2) and RS232 ports located on the back panel.
Boasting a full range of accessories including manipulators, enclosures, antivibration tables, prober control software, chucks, optics and lasers means that each prober can be fully customized for your specific application.
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Semiconductor Characterization Equipment
Analytical Wafer Probers
Wentworth offers a range of high precision analytical wafer probe stations including semi-automatic and manual probers for wafer sizes up to 300 mm to suit your budget. Experienced teams of consultants and global representatives can configure a full turnkey solution to suit your specific needs.
Specifically designed for failure analysis, device characterization and other analytical testing, all probe stations benefit from a full range of prober accessories including manipulators, enclosures, antivibration tables, prober control software, chucks, lasers and optics. This means you can upgrade your wafer probe station at any time to suit future probing goals.
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Multimedia, PRESENTATION SWITCH, Pro av digital system
X100MRX
4K/18G HDBT Rx (100m) with USB, LAN, ARC, L/R Audio In, L/R Audio Output De-Embed, IR, RS-232 (Receiver Only) – Shipping Q3 2019


